As the PV module market shifts toward higher-efficiency modules, with half-cut cells and multi-busbar designs with round wires, it is important to continue to consider the reliability risk associated with changes in module design. While performing EL inspections in the field, a new type of microcrack associated with the combination of these technologies has been spotted, known as edge ribbon cracks. They have been seen to grow during shipping and installation. Claire Kearns-McCoy and George Touloupas of CEA offer a closer look.
CEA has noted that cell cracks can begin to form at the point where interconnect ribbons cross the edge of the cell, and are initially so small as to be difficult to spot even in EL imaging (left image). Further stress on the cells during handling, installation and operation can cause the small cracks to propagate into more serious, performance-threatening issues.
Images: CEA
Stay informed
pv magazine is the leading trade media platform covering the global solar photovoltaics industry. Log in or purchase a digital or print version of this issue to read this article in full.
The cookie settings on this website are set to "allow cookies" to give you the best browsing experience possible. If you continue to use this website without changing your cookie settings or you click "Accept" below then you are consenting to this.